Please use this identifier to cite or link to this item: http://repository.tma.uz/xmlui/handle/1/11055
Title: THE MECHANISM OF CURRENT AUTO-OSCILLATIONS IN COMPENSATED SILICON DOPED WITH IMPURITY ATOMS
Other Titles: THE MECHANISM OF CURRENT AUTO-OSCILLATIONS IN COMPENSATED SILICON DOPED WITH IMPURITY ATOMS
Authors: Zikrillaev, N
Ayupov, K
Shoabdurakhimova, M
Ismaylov, K
Norkulov, N
Abdullaeva, N
Mirkomilova, M
Shukurova, D
Keywords: auto-oscillation, silicon, mechanism, manganese, zinc, sulfur, selenium, electrical field.
Issue Date: 20-Jan-2024
Publisher: Science and Education in Karakalpakstan.
Abstract: The development of new materials and expanded functionalities of existing semiconductor materials and structures allow for the creation of new types of devices with parameters distinct from the existing ones. In this regard, auto-oscillations of current detected in semiconductors are highly relevant in both scientific and practical aspects.
URI: http://repository.tma.uz/xmlui/handle/1/11055
ISSN: 2181-9203
Appears in Collections:Thesis, Articles

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